Surface molecular orientation of poly(2-vinylnaphalene) thin films: ARUPS and NEXAFS studies

Authors
Okudaira, KK Morikawa, E Hite, DA Hasegawa, S Ishii, H Imamura, M Shimada, H Azuma, Y Meguro, K Harada, Y Saile, V Seki, K Ueno, N
Citation
Kk. Okudaira et al., Surface molecular orientation of poly(2-vinylnaphalene) thin films: ARUPS and NEXAFS studies, J ELEC SPEC, 103, 1999, pp. 389-392
Citations number
10
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
103
Year of publication
1999
Pages
389 - 392
Database
ISI
SICI code
0368-2048(199906)103:<389:SMOOPT>2.0.ZU;2-A
Abstract
The molecular orientation at the surfaces of poly(2-vinylnaphthalene) thin films was studied by angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy . The NEXAFS study showed that pendant naphthalene groups are oriented with a tilt angle (beta) of 57 degrees, while the ARUPS study gave information on the tilt-angle distribution as well as the mean value (similar to 58 deg rees) of beta. The mean value of beta determined by ARUPS agrees well with that found in the NEXAFS study. (C) 1999 Elsevier Science B.V. All rights r eserved.