Resonant scattering of polarized soft X-rays for the study of magnetic oxide layers

Authors
Sacchi, M Hague, CF Gota, S Guiot, E Gautier-Soyer, M Pasquali, L Mrowka, S Gullikson, EM Underwood, JH
Citation
M. Sacchi et al., Resonant scattering of polarized soft X-rays for the study of magnetic oxide layers, J ELEC SPEC, 103, 1999, pp. 407-412
Citations number
24
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
103
Year of publication
1999
Pages
407 - 412
Database
ISI
SICI code
0368-2048(199906)103:<407:RSOPSX>2.0.ZU;2-0
Abstract
We report preliminary results that illustrate the potential of resonant sca ttering of polarized soft X-rays applied to the study of the magnetic prope rties of oxide layers. As a test case, we study iron oxides, a class of mat erials of high technological interest, especially when prepared in the form of thin epitaxial layers. (C) 1999 Elsevier Science B.V. All rights reserv ed.