The chemistry, structure and stability of CH3CSNH2 passivated GaAs(100) surfaces

Citation
Ed. Lu et al., The chemistry, structure and stability of CH3CSNH2 passivated GaAs(100) surfaces, J ELEC SPEC, 103, 1999, pp. 429-432
Citations number
9
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
103
Year of publication
1999
Pages
429 - 432
Database
ISI
SICI code
0368-2048(199906)103:<429:TCSASO>2.0.ZU;2-W
Abstract
An organic sulfide, CH3CSNH2 treated sulfur-passivated GaAs(100), has been studied using synchrotron radiation photo-emission spectroscopy (SRPES), Au ger electron spectroscopy (AES) and low energy electron diffraction (LEED). The SRPES and AES measurements show that the treatment removes the GaAs su rface oxide layer and forms sulfides of Ga and As on the surface. The therm al stability and surface structure of the passivated samples at different t emperatures have also been studied. We found that the surface sulfides are also gradually removed and a clean, ordered and thus Fermi level unpinning surface can finally be achieved. Surface restructuring can be observed from the GaAs(100)-S (2x1) pattern between 260 and 450 degrees C to the (4x1) p attern without S between 460 and 550 degrees C. (C) 1999 Elsevier Science B .V. All rights reserved.