Molecular components of the bulk electronic structure of organic conductors: A soft X-ray absorption and soft X-ray emission spectroscopy approach

Citation
Cb. Stagarescu et al., Molecular components of the bulk electronic structure of organic conductors: A soft X-ray absorption and soft X-ray emission spectroscopy approach, J ELEC SPEC, 103, 1999, pp. 539-544
Citations number
19
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
103
Year of publication
1999
Pages
539 - 544
Database
ISI
SICI code
0368-2048(199906)103:<539:MCOTBE>2.0.ZU;2-T
Abstract
The problem of resolving molecular components of the electronic structure o f complex, organic solids with respect to their chemical and orbital charac ter has been approached using soft X-ray absorption (SXA) and soft X-ray em ission (SXE) spectroscopy. These techniques are powerful probes of the site and angular-momentum resolved partial density of states (PDOS) for both oc cupied and unoccupied states. Therefore these spectroscopies are particular ly suited for an analysis of the density of states of multi-atomic, complex materials as the ET-based organic conductors, allowing site-specific elect ronic structure to be measured. We present a preliminary picture of the ele ctronic structure of kappa-ET2Cu(SCN)(2) and kappa-ET2Cu[N(CN)(2)]Br as mea sured by SXE and SXA performed at the C1s and N1s core levels. (C) 1999 Els evier Science B.V. All rights reserved.