Photoemission study of beta-SiC growth by a polyimide Langmuir-Blodgett film on silicon

Citation
Hb. Pan et al., Photoemission study of beta-SiC growth by a polyimide Langmuir-Blodgett film on silicon, J ELEC SPEC, 103, 1999, pp. 685-688
Citations number
5
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
103
Year of publication
1999
Pages
685 - 688
Database
ISI
SICI code
0368-2048(199906)103:<685:PSOBGB>2.0.ZU;2-O
Abstract
Using photoelectron spectroscopies we studied the growth process of SiC on n-Si(lll) by polyimide Langmuir-Blodgett (LB) film. The polyimide pyrolyzes when heated, and leaves a skeleton of carbon atoms on the film surface, wh ich remains the structure of LB films before pyrolysis. At about 800 degree s C, if the polyimide LB film is thin, the substrate Si will outdiffuse qui ckly and form a Si layer on top of the film At 1000 degrees C, the Si from Si-O reacts with carbon from pyrolysis to form SiC. From the results we sug gest that the LB film thickness is an important factor in the growth of goo d quality single crystalline SIC films. (C) 1999 Elsevier Science B.V. All rights reserved.