The use of high-energy synchrotron diffraction for residual stress analyses

Authors
Reimers, W Pyzalla, A Broda, M Brusch, G Dantz, D Schmackers, T Liss, KD Tschentscher, T
Citation
W. Reimers et al., The use of high-energy synchrotron diffraction for residual stress analyses, J MAT SCI L, 18(7), 1999, pp. 581-583
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
18
Issue
7
Year of publication
1999
Pages
581 - 583
Database
ISI
SICI code
0261-8028(19990401)18:7<581:TUOHSD>2.0.ZU;2-V