Accurate assessment of the roughness exponent of a fracture surface via scanning tunnelling microscopy

Citation
J. Deng et al., Accurate assessment of the roughness exponent of a fracture surface via scanning tunnelling microscopy, J PHYS D, 32(12), 1999, pp. L45-L48
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS D-APPLIED PHYSICS
ISSN journal
00223727 → ACNP
Volume
32
Issue
12
Year of publication
1999
Pages
L45 - L48
Database
ISI
SICI code
0022-3727(19990621)32:12<L45:AAOTRE>2.0.ZU;2-A
Abstract
A new straightforward method was proposed to measure the local roughness ex ponent of a scanning tunnelling microscopy (STM) image. Its reliability was tested against some ideal self-affine surfaces. Taking the mean value of a number of local roughness exponents for the STM images, which were randoml y recorded on a fracture surface, as the roughness exponent of the fracture surface, we quantitatively assessed the experimental error of the measured roughness exponent by statistical analysis. The experimental results for t wo different fracture surfaces showed that the difference between the two r oughness exponents was not produced by their experimental errors to a 90% p robability.