We have performed time-resolved measurements of porous silicon (PS) photolu
minescence (PL) at temperatures in the range from 15 K to 300 K for differe
nt emission energies. For the first time we have observed lifetimes of radi
ative recombination ranging from nanoseconds to seconds. Strong phosphoresc
ence was revealed for as-prepared samples at 15 K and also for partly oxidi
zed specimens at room temperature. The PS luminescence had a polarized comp
onent that was strongly dependent upon the detection energy and the prehist
ory of the specimens studied. We analyse two possible scenarios of radiativ
e recombination in PS: (1) migration of nonequilibrium charge carriers betw
een nanometre-sized silicon clusters prior to recombination; (2) geminate r
ecombination of charge carriers thermalized in the same or neighbouring sil
icon domains. Combination of these scenarios allows us to explain the PL of
PS on all timescales from one viewpoint. We present direct Monte Carlo sim
ulations of recombination processes in PS, and show that the results are in
good agreement with experimental data.