We report photoluminescence spectra measured for two series of silica aerog
el sintered at 1000 degrees C in different time intervals. In the photolumi
nescence spectra of nonsintered sample, bands at 1.8, 2.0 and 2.2 eV are id
entified. During sintering process, the bands at 1.8 and 2.0 eV decrease an
d vanish, while the band at 2.2 eV shows more complicated behavior. Accordi
ng to infrared spectra of the same samples we find that the photoluminescen
ce band at 1.8 eV originates from nonbridged oxygen hole center defect, and
that at 2.0 eV originates from silane in the gel network. Nonstoichiometri
c SiOx causes photoluminescence band at 2.2 eV.