Density functional theory applied to the calculation of dielectric constant of low-k materials (vol 39, pg 279, 1999)

Citation
A. Courtot-descharles et al., Density functional theory applied to the calculation of dielectric constant of low-k materials (vol 39, pg 279, 1999), MICROEL REL, 39(4), 1999, pp. 549-549
Citations number
1
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
39
Issue
4
Year of publication
1999
Pages
549 - 549
Database
ISI
SICI code
0026-2714(199904)39:4<549:DFTATT>2.0.ZU;2-1