Plasmon DOS in layered systems: two layers per unit cell

Citation
K. Schulte et al., Plasmon DOS in layered systems: two layers per unit cell, PHYSICA C, 318, 1999, pp. 554-557
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
318
Year of publication
1999
Pages
554 - 557
Database
ISI
SICI code
0921-4534(199905)318:<554:PDILST>2.0.ZU;2-B
Abstract
In this paper we present the partial and total DOS of the plasmons in a lay ered electron gas system consisting of two layers per unit cell using the R andom Phase Approximation. The description of a lattice in terms of conduct ing bilayers surrounded by a non-conducting medium can be seen as a first a pproximation to oxide superconductors like Bi2212 and Tl2212. The relevancy of the partial density of states for experimental probes like reflection E ELS will be briefly discussed. Preceding the exact description of the parti al DOS we will give a short summary of the derivation of the plasmon disper sion in a two layer/unit cell system [A. Griffin, A.J. Pindor, Phys. Rev. B 39 (1989) 11503] and describe the two different branches that emerge. Fina lly, the total DOS is calculated numerically and is compared to the one lay er/unit cell case. (C) 1999 Elsevier Science B.V. All rights reserved.