L. Firlej et al., Field-induced diffusion of gold and related phase transformations in the C-60 and C-70 fullerenes, PHYS REV B, 59(24), 1999, pp. 16028-16032
The intercalation of metal M (M = Au, Ag, In) from the electrode into the p
olycrystalline C-60 and C-70 thin films is studied by time-dependent and sp
ace-resolved conductivity measurements under controlled oxygen-free atmosph
ere at different temperatures and electric fields. The time resistivity beh
avior is interpreted on the basis of electric-field-induced diffusion of me
tal ions from the electrodes to the interstitials of the fullerene crystal
lattice and local formation of MxC60 and MxC70 phases. A comparison between
the resistivity behaviors of C-60 and C-70 thin films provides evidence th
at the process is sensitive to the electronic level structure of the fuller
enes molecules. [S0163-1829(99)08823-2].