Ultrafast dephasing of continuum transitions in bulk semiconductors

Citation
S. Arlt et al., Ultrafast dephasing of continuum transitions in bulk semiconductors, PHYS REV B, 59(23), 1999, pp. 14860-14863
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
59
Issue
23
Year of publication
1999
Pages
14860 - 14863
Database
ISI
SICI code
0163-1829(19990615)59:23<14860:UDOCTI>2.0.ZU;2-5
Abstract
We have studied the coherent emission from bulk semiconductors by spectrall y resolved and spectrally integrated four-wave mixing (FWM) with broadband 16-fs pulses in the carrier density range from x 10(16) cm(-3) to 6 x 10(17 ) cm(-3), in GaAs, only continuum transitions are excited, while both excit onic and continuum transitions are excited in Al0.06Ga0.94As. The decay of the FWM signal for positive time delays unambiguously reflects the dephasin g of the continuum, irrespective of the excitation of excitonic transitions . We find identical ultrafast sub-20-fs decay times of the coherent emissio n from continuum transitions in GaAs and Al0.06Ga0.94As, independent of the excess excitation energy. These decay times depend only weakly on the carr ier density for densities below 10(17) cm(-3). The continuum dephasing is a nalyzed considering carrier-carrier and carrier-LO-phonon scattering in a r elaxation rate approach. The excitonic transitions in Al0.06Ga0.94As domina te the FWM signal at negative time delays.