O-18(-) time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems

Authors
Gerlock, JL Prater, TJ Kaberline, SL Dupuie, JL Blais, EJ Rardon, DE
Citation
Jl. Gerlock et al., O-18(-) time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems, POLYM DEGR, 65(1), 1999, pp. 37-45
Citations number
22
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
POLYMER DEGRADATION AND STABILITY
ISSN journal
01413910 → ACNP
Volume
65
Issue
1
Year of publication
1999
Pages
37 - 45
Database
ISI
SICI code
0141-3910(1999)65:1<37:OTSIMS>2.0.ZU;2-1
Abstract
Time-of-flight secondary ion mass spectroscopy has been used to image the O -18-labeled products formed in all coating layers when automotive paint sys tems are exposed to ultraviolet light and heat in an O-18(2) atmosphere. Th e O-18(-) ion intensity maps observed for model paint systems match the exp ected effects of ultraviolet light absorber additives, hindered amine light stabilizer additives, and pigments on photooxidation. The O-18(-) ion inte nsity maps observed for paint systems weathered in Florida for 3 years and then subsequently exposed to ultraviolet light for 1000 h in a 25% O-18(2) in dry nitrogen atmosphere correctly anticipate their long-term, >8 years, Florida exposure behavior, (C) 1999 Elsevier Science Ltd. All rights reserv ed.