Ma. Wani et Dt. Pham, Efficient control chart pattern recognition through synergistic and distributed artificial neural networks, P I MEC E B, 213(2), 1999, pp. 157-169
Citations number
20
Categorie Soggetti
Engineering Management /General
Journal title
PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART B-JOURNAL OF ENGINEERING MANUFACTURE
Accurate and fast control chart pattern recognition is essential for effici
ent system monitoring to maintain the production of high-quality goods. Thi
s paper addresses three major issues of control chart pattern recognition:
(a) transparency, (b) accuracy and (c) fast detection of abnormal patterns.
A new approach is described which uses novel shape features extracted from
a control chart pattern (CCP) instead of the unprocessed CCP data or its s
tatistical properties. These features represent the shape of the CCP explic
itly. A set of algorithms is described for extraction of the shape features
from a CCP. The paper discusses the use of artificial neural networks for
recognition of the shape features. Synergistic, distributed and distributed
synergistic neural networks are proposed for learning efficiently non-line
ar characteristics and overlapping ranges of values of the data set describ
ing CCPs. The paper presents the results of analysing several hundred contr
ol chart patterns and gives a comparison with those reported in previous wo
rk.