Surface evaluation of self-assembled multilayered organic films by atomic force microscopy

Authors
Assis, OBG Vieira, DC Bernardes, R
Citation
Obg. Assis et al., Surface evaluation of self-assembled multilayered organic films by atomic force microscopy, SCANNING, 21(2), 1999, pp. 71-72
Citations number
4
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
SCANNING
ISSN journal
01610457 → ACNP
Volume
21
Issue
2
Year of publication
1999
Pages
71 - 72
Database
ISI
SICI code
0161-0457(199903/04)21:2<71:SEOSMO>2.0.ZU;2-E