Electric force microscopy of induced charges and surface potentials in GaNmodified by light and strain

Authors
Bridger, PM Bandic, ZZ Piquette, EC McGill, TC
Citation
Pm. Bridger et al., Electric force microscopy of induced charges and surface potentials in GaNmodified by light and strain, SCANNING, 21(2), 1999, pp. 78-79
Citations number
17
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
SCANNING
ISSN journal
01610457 → ACNP
Volume
21
Issue
2
Year of publication
1999
Pages
78 - 79
Database
ISI
SICI code
0161-0457(199903/04)21:2<78:EFMOIC>2.0.ZU;2-Z