A surface science investigation of device structures exposed to high poweroperational stress

Authors
Cole, MW Fountzoulas, CG Demaree, D
Citation
Mw. Cole et al., A surface science investigation of device structures exposed to high poweroperational stress, SCANNING, 21(2), 1999, pp. 79-80
Citations number
3
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
SCANNING
ISSN journal
01610457 → ACNP
Volume
21
Issue
2
Year of publication
1999
Pages
79 - 80
Database
ISI
SICI code
0161-0457(199903/04)21:2<79:ASSIOD>2.0.ZU;2-2