Towards sub-angstrom electron probes by Cs-corrected scanning tunneling electron microscopy

Authors
Krivanek, OL Dellby, N
Citation
Ol. Krivanek et N. Dellby, Towards sub-angstrom electron probes by Cs-corrected scanning tunneling electron microscopy, SCANNING, 21(2), 1999, pp. 90-91
Citations number
4
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
SCANNING
ISSN journal
01610457 → ACNP
Volume
21
Issue
2
Year of publication
1999
Pages
90 - 91
Database
ISI
SICI code
0161-0457(199903/04)21:2<90:TSEPBC>2.0.ZU;2-W