Probing the origin of interfacial properties by scanning tunneling electron microscopy

Authors
Pennycook, SJ Kim, M Browning, ND Sohlberg, K Buczko, R Pantelides, ST
Citation
Sj. Pennycook et al., Probing the origin of interfacial properties by scanning tunneling electron microscopy, SCANNING, 21(2), 1999, pp. 92-93
Citations number
5
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
SCANNING
ISSN journal
01610457 → ACNP
Volume
21
Issue
2
Year of publication
1999
Pages
92 - 93
Database
ISI
SICI code
0161-0457(199903/04)21:2<92:PTOOIP>2.0.ZU;2-F