ill order to achieve enhanced-Raman scattering without a metallic thin film
s, an attenuated total reflection (ATR) arrangement consisting of a prism,
an amorphous SiO2 gap layer, a copper phthalocyanine (CuPc) thill film and
a fused quartz substrate was constructed. The ATR spectra exhibited sharp d
ips corresponding to the excitation of half-leaky guided modes, which are l
eaky in the prism, guided waves inside the SiO2 gap layer and exponentially
decay inside the substrate. Under excitation of the modes, Raman scatterin
g from the CuPc film was found to be enhanced by a factor of similar to 10(
2) over the normal Raman scattering. The present Raman enhancement can be w
ell explained by strong electromagnetic fields induced in the CuPc film upo
n excitation of the half-leaky guided modes. (C) 1999 Elsevier Science B.V.
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