Citation
E. Csahok et al., Optical beam deflection study of indium-hexacyanoferrate films, SYNTH METAL, 103(1-3), 1999, pp. 2687-2688
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SYNTHETIC METALS
ISSN journal
03796779
→ ACNP
Volume
103
Issue
1-3
Year of publication
1999
Pages
2687 - 2688
Database
ISI
SICI code
0379-6779(199906)103:1-3<2687:OBDSOI>2.0.ZU;2-R
Abstract
Optical beam deflection technique was employed to follow the ion transport
and ion exchange processes taking place in the course of redox transformati
ons of indium-hexacyanoferrate surface layers. The data analysis by the hel
p of a convolution method attested that the principal charge compensating i
ons are cations and the contribution of anions to the charge neutralization
inside the film is less than a few percents in the range [0, 0.85 V].