Imaging of electrical features in organic thin films by scanning Maxwell-stress microscopy

The scanning Maxwell-stress microscopy (SMM) is a dynamic noncontact electr ic force microscopy that allows simultaneous access to the electrical prope rties of molecular system such as surface potential, surface charge, dielec tric constant and conductivity along with the topography. Here we report ou r recent results of its application to nanoscopic study of domain structure s and electrical functionality in organic thin films prepared by the Langmu ir-Blodgett technique.