Surface characterization of TTF-TCNQ thin films evaporated on alkali halide substrates

Authors
Caro, J Fraxedas, J Santiso, J Figueras, A Gorostiza, P Sanz, F
Citation
J. Caro et al., Surface characterization of TTF-TCNQ thin films evaporated on alkali halide substrates, SYNTH METAL, 102(1-3), 1999, pp. 1607-1608
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SYNTHETIC METALS
ISSN journal
03796779 → ACNP
Volume
102
Issue
1-3
Year of publication
1999
Pages
1607 - 1608
Database
ISI
SICI code
0379-6779(199906)102:1-3<1607:SCOTTF>2.0.ZU;2-3
Abstract
Thin films of TTF-TCNQ have been grown on ex situ cleaved NaCl (001) and KC l (001) substrates by thermal evaporation in high vacuum. The films are pol ycrystalline and textured, composed of microcrystals with rectangular shape with the c* crystallographic axis perpendicular to the substrate. The in-p lane texture of the films has been studied by X-ray diffraction (XRD) and t he surface morphology has been analyzed by means of Scanning Electron Micro scopy (SEM) and Tapping Mode Atomic Force Microscopy (TMAFM).