Anisotropic optical properties of doped poly(3,4-ethylenedioxythiophene) (P
EDOT) thin films have been determined by using variable-angle spectroscopic
ellipsometry together with intensity reflectance and transmission spectrop
hotometry. The optical anisotropy of the PEDOT films are of uniaxial charac
ter with the optic axis normal to the film surface. The (ordinary) index of
refraction in the plane shows a metallic state behavior while the out of p
lane (extraordinary) index of refraction shows a near dielectric character.
The metallic state behavior in the surface plane agrees well with the high
electrical conductivity measured for this material. The anisotropic optica
l properties of doped PEDOT thin films in terms of the complex indices of r
efraction together with results from grazing incidence X-ray diffraction st
udies allow us to deduce a preferential orientation of the polymer chains.