Electrical study of impurity states in conjugated polymers

Citation
P. Stallinga et al., Electrical study of impurity states in conjugated polymers, SYNTH METAL, 101(1-3), 1999, pp. 496-497
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SYNTHETIC METALS
ISSN journal
03796779 → ACNP
Volume
101
Issue
1-3
Year of publication
1999
Pages
496 - 497
Database
ISI
SICI code
0379-6779(199905)101:1-3<496:ESOISI>2.0.ZU;2-T
Abstract
Schottky diodes resulting from an intimate contact of aluminum on electro-d eposited poly(3-methylthiopene), PMeT, have been studied by admittance spec troscopy, capacitance-voltage and current-voltage measurements, and optical ly-induced current transients. The loss-tangents show the existence of inte rface states that can be removed by vacuum annealing, also visible in the t ransients. Furthermore, the CV curves don't substantiate the idea of moveme nt of the dopant ions.