The structures of free standing films of polyaniline (PAni) protonated by c
amphorsulfonic acid (CSA) are characterized by different scattering techniq
ues: WAXD, IINS, SANS and SEM. In this way, we could investigate the comple
x structural arrangement of these films at different length scales. It is s
hown that a unique description of structure and microstructure of such film
s is not realistic since they tightly depend on the conditions of preparati
on and processing. This contribution gives an account of the most important
structural data obtained on films prepared in Grenoble (France) during the
four last years.