Epitaxial growth of nitride semiconductor films by laser ablation

Citation
A. Yoshida et al., Epitaxial growth of nitride semiconductor films by laser ablation, THIN SOL FI, 344, 1999, pp. 127-129
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
344
Year of publication
1999
Pages
127 - 129
Database
ISI
SICI code
0040-6090(199904)344:<127:EGONSF>2.0.ZU;2-4
Abstract
GaN epitaxial films on (0001)sapphire substrates were fabricated by laser a blation. An ArF excimer laser(193 nm, 25 ns) with an energy of 140 mJ/pulse was used for ablating cold-pressed GaN targets made from high-purity GaN p owders. Just before the deposition, thermal cleaning of the substrate surfa ce at 1073 K was essential. The substrate temperature was varied between 87 3 and 1073 K. Above 973 K, the epitaxial layers were obtained. When a buffe r layer of GaN was deposited at lower temperatures before the epitaxial gro wth, the crystalline quality and surface morphology were greatly improved. (C) 1999 Elsevier Science S.A. All rights reserved.