Structural analysis of epitaxial TiAg MgO superlattices prepared by multi-evaporation

Citation
T. Kado et al., Structural analysis of epitaxial TiAg MgO superlattices prepared by multi-evaporation, THIN SOL FI, 344, 1999, pp. 545-549
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
344
Year of publication
1999
Pages
545 - 549
Database
ISI
SICI code
0040-6090(199904)344:<545:SAOETM>2.0.ZU;2-5
Abstract
Metal/insulator multilayers composed of Ti1-xAgx (0.26 < x < 0.54) alloy an d MgO were prepared on MgO(001) substrates at 273 K by electron beam evapor ation in ultrahigh vacuum. Ti-Ag alloy layers in the superlattices were dep osited using two E-guns of Ti and AE simultaneously, at the various deposit ion rates. X-ray diffraction and transmission electron microscopic measurem ents revealed that TiAg/MgO multilayers were epitaxially grown superlattice and that Ti-Ag in the superlattices were tetragonal or cubic structures. A fter I h heating at 573 K the X-ray diffraction pattern in low angle region showed superlattice structures, but the modulating wavelengths of the supe rlattice were found to be smaller than those of as-grown superlattices. (C) 1999 Elsevier Science S.A. All rights reserved.