Incorporation of Ga metalorganic precursors during transients at the startof GaAs growth in CBE

Citation
D. Hill et al., Incorporation of Ga metalorganic precursors during transients at the startof GaAs growth in CBE, THIN SOL FI, 344, 1999, pp. 554-557
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
344
Year of publication
1999
Pages
554 - 557
Database
ISI
SICI code
0040-6090(199904)344:<554:IOGMPD>2.0.ZU;2-N
Abstract
We have used normal incidence reflectivity and reflection anisotropy spectr oscopy (RAS) to study the initial period of chemical beam epitaxy (CBE) gro wth of GaAs using either triethylgallium (TEGa) or trimethylgallium (TMGa) as group III precursors. With TEGa as the precursor, a transitory period, w hich can last for tens of seconds depending on the III/V ratio, is observed in both R and RAS before normal growth is established. With TMGa there is no transitory period evident in the R measurements for any III/V ratio and only a short transitory period exists in the RA measurements. These results are discussed in terms of the formation of a metallic-like surface addlaye r, which subsequently becomes incorporated when using TEGa, in marked contr ast to the self-limiting behaviour when using TMGa. (C) Published by Elsevi er Science S.A. All rights reserved.