We have used normal incidence reflectivity and reflection anisotropy spectr
oscopy (RAS) to study the initial period of chemical beam epitaxy (CBE) gro
wth of GaAs using either triethylgallium (TEGa) or trimethylgallium (TMGa)
as group III precursors. With TEGa as the precursor, a transitory period, w
hich can last for tens of seconds depending on the III/V ratio, is observed
in both R and RAS before normal growth is established. With TMGa there is
no transitory period evident in the R measurements for any III/V ratio and
only a short transitory period exists in the RA measurements. These results
are discussed in terms of the formation of a metallic-like surface addlaye
r, which subsequently becomes incorporated when using TEGa, in marked contr
ast to the self-limiting behaviour when using TMGa. (C) Published by Elsevi
er Science S.A. All rights reserved.