XRD measurements of the structure factors of diamond

Citation
Jca. Boeyens et al., XRD measurements of the structure factors of diamond, Z KRISTALL, 214(6), 1999, pp. 351-352
Citations number
7
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ZEITSCHRIFT FUR KRISTALLOGRAPHIE
ISSN journal
00442968 → ACNP
Volume
214
Issue
6
Year of publication
1999
Pages
351 - 352
Database
ISI
SICI code
0044-2968(1999)214:6<351:XMOTSF>2.0.ZU;2-Y
Abstract
Sixtyseven structure factors for a spheroidal, single crystal of diamond (m ax diam = 0.052 cm, min diam = 0.040 cm) were measured by XRD with synchrot ron radiation and lambda = 0.4 Angstrom. The data were corrected for isotro pic extinction from measurements taken with lambda = 0.7 Angstrom. The whol e sphere of reflections, up-to a resolution of 0.27 Angstrom, was observed. The esd's of the structure factors were of the order of 0.006 e/atom and 0 .002 e/atom for the low (except 111) and high order reflections, respective ly. Despite of the large size of the specimen, the observed data agreed bet ter with published theoretical structure factors than previous experimental structure factors. It is the first complete XRD single crystal data-set si nce 1939.