Quantitative SERS measurements on dielectric-overcoated silver-island films by solution deposition control of surface concentrations

Citation
Wb. Lacy et al., Quantitative SERS measurements on dielectric-overcoated silver-island films by solution deposition control of surface concentrations, ANALYT CHEM, 71(13), 1999, pp. 2564-2570
Citations number
38
Categorie Soggetti
Chemistry & Analysis","Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICAL CHEMISTRY
ISSN journal
00032700 → ACNP
Volume
71
Issue
13
Year of publication
1999
Pages
2564 - 2570
Database
ISI
SICI code
0003-2700(19990701)71:13<2564:QSMODS>2.0.ZU;2-V
Abstract
A simple method to control the dosing of small adsorbate molecules onto sol id surfaces from liquid solution is applied to quantitative surface-enhance d Raman scattering measurements on dielectric-overcoated silver-island film s. The deposition method, based on substrate withdrawal from solution, is e valuated by measuring fluorescence (ex situ) and optical absorption (in sit u) of dye molecules deposited onto glass surfaces, Control of adsorbate sur face concentrations was accomplished by varying the withdrawal rate and the concentration of the dye in solution. The dosing method was used to study the dependence of the electromagnetic contribution to SERS enhancement on s urface coverage of scatterer. The sensitivity enhancement was found to be c onstant for adsorbate coverages up to 60-80% of a monolayer. Beyond a full monolayer, SERS enhancement for additional molecules deposited onto the sur face was found to drop significantly, by as much as 1 order of magnitude.