Electronic states at conducting polymer conducting oxide interfaces observed using a low-energy photoelectron spectroscopic method

Citation
N. Nakanishi et al., Electronic states at conducting polymer conducting oxide interfaces observed using a low-energy photoelectron spectroscopic method, APPL PHYS L, 75(2), 1999, pp. 226-228
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
2
Year of publication
1999
Pages
226 - 228
Database
ISI
SICI code
0003-6951(19990712)75:2<226:ESACPC>2.0.ZU;2-7
Abstract
We have observed the electronic states at conducting polymer/conducting oxi de interfaces using a low-energy photoelectron spectroscopic method. The el ectronic states of conducting polymer/indium tin oxide (ITO) interfaces wer e different from those of conducting polymer/metal interfaces. The electron transfer from a conducting polymer to ITO occurred at the interfaces, and is not related to the difference of the ionization potential between conduc ting polymers and ITO. Although the origin of this electron transfer is not clear at this stage, we speculate that the surface states of ITO play a ma jor role. Moreover, the electron transfer at the interfaces is enhanced at higher temperatures. Other conducting oxides such as indium oxide (In2O3) a nd tin oxide (SnO2) also show a similar tendency to that of ITO. (C) 1999 A merican Institute of Physics. [S0003-6951(99)01928-2].