L. Ackermann et W. Kulisch, Investigation of diamond etching and growth by in situ scanning tunneling microscopy, DIAM RELAT, 8(7), 1999, pp. 1256-1260
Recently we published a new experimental set-up for the investigation of dy
namic processes under diamond deposition conditions. In the present paper t
he first measurements of diamond etching and growth with this set-up are pr
esented. Etching experiments at 500 degrees C substrate temperature reveal
no etching of the pre-grown diamond film used as sample, whereas at 530 deg
rees C rapid etching of a (111)-faceted crystal and slow etching of a (100)
-faceted crystal is visible. Similar, at 500 degrees C no growth could be d
etected oa a boron doped (100)-single crystal, but at 530 degrees C growth
was monitored with a rate comparable with that of the etching rate of the (
100)-plane at the same substrate temperature (about 10 nm h(-1)). (C) 1999
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