Investigation of diamond etching and growth by in situ scanning tunneling microscopy

Citation
L. Ackermann et W. Kulisch, Investigation of diamond etching and growth by in situ scanning tunneling microscopy, DIAM RELAT, 8(7), 1999, pp. 1256-1260
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
8
Issue
7
Year of publication
1999
Pages
1256 - 1260
Database
ISI
SICI code
0925-9635(199907)8:7<1256:IODEAG>2.0.ZU;2-I
Abstract
Recently we published a new experimental set-up for the investigation of dy namic processes under diamond deposition conditions. In the present paper t he first measurements of diamond etching and growth with this set-up are pr esented. Etching experiments at 500 degrees C substrate temperature reveal no etching of the pre-grown diamond film used as sample, whereas at 530 deg rees C rapid etching of a (111)-faceted crystal and slow etching of a (100) -faceted crystal is visible. Similar, at 500 degrees C no growth could be d etected oa a boron doped (100)-single crystal, but at 530 degrees C growth was monitored with a rate comparable with that of the etching rate of the ( 100)-plane at the same substrate temperature (about 10 nm h(-1)). (C) 1999 Elsevier Science S.A. All rights reserved.