Trajectories of field emitted ions in 3D atom-probe

Citation
F. Vurpillot et al., Trajectories of field emitted ions in 3D atom-probe, EPJ-APPL PH, 6(2), 1999, pp. 217-221
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
ISSN journal
12860042 → ACNP
Volume
6
Issue
2
Year of publication
1999
Pages
217 - 221
Database
ISI
SICI code
1286-0042(199905)6:2<217:TOFEII>2.0.ZU;2-F
Abstract
The improvement of the lateral resolution of 3D atom probe requires the ion trajectories to be determined accurately. For the first time, the atomic s tructure of the emitter (a sharp tip) and the gradual change of its topolog y during evaporation are taken into account. Atoms submitted to the highest field are removed one by one. Ion trajectories are then simulated step by step after each atom has been removed from the sample surface. The recurren t use of a simulation software (SIMION 3D) for each elemental step makes it possible to model the image transfer function of 3D atom-probe for a non-s tationary shape of the emitter. This dynamic model, applied to atom probe d ata, is shown to correct for the major aberrations present at the centre of low-index poles. The well-known depleted zone present at the pole centre i s shown to disappear using this model. An almost constant density of atoms is then observed over the entire analysis area. For the first time, a physi cal interpretation of these depleted zones is provided and confirmed throug h simulation and experiments.