Effect of interfacial scattering on the magnetoresistance of magnetic tunnel junctions

Citation
A. Vedyayev et al., Effect of interfacial scattering on the magnetoresistance of magnetic tunnel junctions, EUROPH LETT, 46(6), 1999, pp. 808-814
Citations number
28
Categorie Soggetti
Physics
Journal title
EUROPHYSICS LETTERS
ISSN journal
02955075 → ACNP
Volume
46
Issue
6
Year of publication
1999
Pages
808 - 814
Database
ISI
SICI code
0295-5075(19990615)46:6<808:EOISOT>2.0.ZU;2-1
Abstract
In theories of electron tunneling between metallic layers, one fundamental question remains: which is the relevant density of states which determines the tunnel current through the barrier? In this letter, the influence of el ectron scattering at the metal/oxide interface in magnetic tunnel junctions on the tunnel current is addressed from a theoretical point of view. Two c ontributions to the tunnel current and to the magnetoresistance of these ju nctions are obtained: one from specular transmission through the barrier wh ich is related to the one-dimensional density of states next to the metal/o xide interface, the other hom tunneling assisted by interfacial scattering which depends bath on the one-dimensional and three-dimensional density of states. The effect of spin-flip scattering on the impurities is discussed a s well.