A broad beam ion gun has been designed and tested that requires only a sing
le high voltage supply. It creates 1-2-mm-diameter 2-10 kV beams that are v
isually uniform in spatial intensity with a sharp edge cutoff using a Perrh
enate solid state ion source. The gun's electrode geometry is designed to m
ake beam diameter independent of acceleration voltage. Moreover, the source
is imaged at the focal length of the acceleration optics to obtain a beam
with visually uniform spatial intensity. With this approach, all points on
the source's emission surface contribute equally to the brightness of each
point in the beam. The univoltage ion gun design has demonstrated its utili
ty in broad beam static secondary ionization mass spectrometry (SIMS) instr
uments and is being adopted as the ion gun of choice for many of our group'
s instruments. (C) 1999 Elsevier Science B.V.