XPS quantitative analysis and models of supported oxide catalysts

Citation
A. Cimino et al., XPS quantitative analysis and models of supported oxide catalysts, J ELEC SPEC, 104(1-3), 1999, pp. 1-29
Citations number
89
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
104
Issue
1-3
Year of publication
1999
Pages
1 - 29
Database
ISI
SICI code
0368-2048(199907)104:1-3<1:XQAAMO>2.0.ZU;2-Y
Abstract
Application of XPS to the quantitative analysis of supported oxide catalyst s is reviewed. Starting from the basic quantitative equations of XPS, the d evelopment of different models is summarized, including those for flat surf aces and rough profile surfaces, as well as models treating high surface ar ea and porous materials. The significance of the approximations used in the various models is discussed, and the different approaches are compared. Ex amples from the literature are reported and critically evaluated to illustr ate practical examples of application. (C) 1999 Elsevier Science B.V. All r ights reserved.