XPS, AES and Auger parameter of Pd and PdO

Citation
M. Brun et al., XPS, AES and Auger parameter of Pd and PdO, J ELEC SPEC, 104(1-3), 1999, pp. 55-60
Citations number
9
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
104
Issue
1-3
Year of publication
1999
Pages
55 - 60
Database
ISI
SICI code
0368-2048(199907)104:1-3<55:XAAAPO>2.0.ZU;2-Z
Abstract
Auger and X-ray photoelectron spectra of palladium and palladium oxide were recoded with a MgK alpha primary X-ray source. The Pd3d(5/2) binding energ ies are 335.4 eV and 336.8 eV for Pd and PdO respectively. While the most w idely used M-4,M-5 VV Auger structure is rather well defined for pure Pd, w ith a peak maximum measured at a kinetic energy of 327.5 eV, this is not th e case for PdO. Consequently, it is difficult to compare the Pd3d-MVV Auger parameters of these two compounds. This is mainly due to the strong change s evidenced in the structure of the valence band. On the contrary. the shap e of the less intense M4,5N2,3N2,3 Auger peak, which implies only the Pd3d and the Pd4p core levels, does not change much between Pd and PdO. The maxi mum of the MNN Auger peak is measured at 242.8 eV and 240.5 eV for Pd and P dO respectively. (C) 1999 Elsevier Science B.V. All rights reserved.