Very high resolution electron spectroscopy with third generation synchrotron radiation sources: the resonant Auger decay spectrum of the Xe 4d(5/2)(-1)6p state

Authors
Ohrwall, G Bozek, J Baltzer, P
Citation
G. Ohrwall et al., Very high resolution electron spectroscopy with third generation synchrotron radiation sources: the resonant Auger decay spectrum of the Xe 4d(5/2)(-1)6p state, J ELEC SPEC, 104(1-3), 1999, pp. 209-212
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
104
Issue
1-3
Year of publication
1999
Pages
209 - 212
Database
ISI
SICI code
0368-2048(199907)104:1-3<209:VHRESW>2.0.ZU;2-V
Abstract
We have recorded an Auger decay spectrum of the resonantly excited Xe 4d(5/ 2)(-1)6p state between 36.4 and 37.3 eV kinetic energy. The spectrum was ob tained under resonant Raman conditions, with a bandwidth of approximate to 6 meV for the exciting radiation, much smaller than the natural lifetime wi dth of 110-120 meV. The full width at half maximum of the peaks in the spec trum was 10 meV, making it possible to completely resolve structure that ov erlapped in earlier studies. (C) 1999 Elsevier Science B.V. All rights rese rved.