The fluorescence EXAFS spectra, measured at a grazing incidence angle large
r than the critical angle for total reflection, were examined to test a num
erical conversion from the distorted fluorescence data to the 'true' absorp
tion spectra, achieving a reliable transferability between the transmission
and the fluorescence data. Under various entrance and exit angles, full nu
merical corrections were made in terms of the sample's self-absorption, the
measurement geometry, and the energy dependent efficiency function of the
I,, ionization chamber detector. Particularly, a numerical code was develop
ed for the x-ray fluorescence geometry configured without a scattering disc
rimination filter. For an illustration of glancing-angle fluorescence EXAFS
spectra, we performed an in-situ measurement for the thick porous nickel s
pecimens undergoing a heated-air surface oxidation process.