Edge separation using diffraction anomalous fine structure

Citation
B. Ravel et al., Edge separation using diffraction anomalous fine structure, J SYNCHROTR, 6, 1999, pp. 338-340
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF SYNCHROTRON RADIATION
ISSN journal
09090495 → ACNP
Volume
6
Year of publication
1999
Part
3
Pages
338 - 340
Database
ISI
SICI code
0909-0495(19990501)6:<338:ESUDAF>2.0.ZU;2-1
Abstract
We exploit the crystallographic sensitivity of the Diffraction Anomalous Fi ne-Structure (DAFS) measurement to separate the fine structure contribution s of different atomic species with closely spaced resonant energies. In BaT iO3 the Ti K edge and Ba Lm edges are separated by 281 eV, or about 8.2 Ang strom(-1), thus severely limiting the information content of the Ti K edge signal. Using the site selectivity of DAFS we can separate the two fine str ucture spectra using an iterative Kramers-Kronig method, thus extending the range of the Ti K edge spectrum. This technique has application to many ra re earth/transition metal compounds, including many magnetic materials of t echnological significance for which K and L edges overlap in energy.