Structural transition in epitaxial Co Cr multilayers as studied by X-ray absorption spectroscopy

Citation
Wf. Pong et al., Structural transition in epitaxial Co Cr multilayers as studied by X-ray absorption spectroscopy, J SYNCHROTR, 6, 1999, pp. 746-748
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF SYNCHROTRON RADIATION
ISSN journal
09090495 → ACNP
Volume
6
Year of publication
1999
Part
3
Pages
746 - 748
Database
ISI
SICI code
0909-0495(19990501)6:<746:STIECC>2.0.ZU;2-W
Abstract
We have performed Cr and Co K-edge x-ray-absorption measurements to investi gate the dependence of local electronic and atomic structures on the Cr-lay er thickness in epitaxial Co (40 Angstrom)/Cr (t(Cr)) (t(Cr) = 2, 3, 5, 7, and 9 Angstrom) multilayers. The Cr K x-ray absorption near edge structure (XANES) spectra of Co/Cr multilayers indicate an abrupt transition of the C r layer from a bcc structure to a hcp structure when the thickness of the C r layer is decreased down to similar to 5 Angstrom or three atomic layers. The structural transition and bond-length distortion in Cr and Co layers ob served in the extended x-ray absorption fine structure (EXAFS) measurements are consistent with the XANES results.