Admittance spectroscopy of Mg-doped GaN grown by molecular beam epitaxy using RF nitrogen sources

Citation
Dj. Kim et al., Admittance spectroscopy of Mg-doped GaN grown by molecular beam epitaxy using RF nitrogen sources, J KOR PHYS, 34, 1999, pp. S261-S264
Citations number
16
Categorie Soggetti
Physics
Journal title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
ISSN journal
03744884 → ACNP
Volume
34
Year of publication
1999
Supplement
S
Pages
S261 - S264
Database
ISI
SICI code
0374-4884(199906)34:<S261:ASOMGG>2.0.ZU;2-K
Abstract
Thermal activation energies of Mg in GaN grown using RF nitrogen source wit h varying hag flux were examined using an admittance spectroscopy technique . There was no noticeable difference or trend in the activation energy with varying MB flux. The thermal activation energy for GaN:Mg was similar to 1 15 meV under the investigated Mg flux range. Negligible persistent photo-co nductivity and yellow luminescence peak in PL observed in the samples sugge st possible reduction of the thermal activation energies compared to the va lues in the literature.