Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry

Authors
Kim, TJ Kim, YD Yoo, SD Aspnes, DE Kossut, J
Citation
Tj. Kim et al., Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry, J KOR PHYS, 34, 1999, pp. S496-S498
Citations number
15
Categorie Soggetti
Physics
Journal title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
ISSN journal
03744884 → ACNP
Volume
34
Year of publication
1999
Supplement
S
Pages
S496 - S498
Database
ISI
SICI code
0374-4884(199906)34:<S496:DFOCAF>2.0.ZU;2-5
Abstract
We report new measurement of the above-bandgap optical properties of zincbl end Cd0.57Mg0.43Te ternary alloy film. These differ from previous data on b ulk alloys, in that the present <epsilon(2)> values are much lower and high er near E-0 fundamental edge and E-2-peak, respectively, indicating that th e present spectra are closer to the true bulk dielectric function of this a lloy. Energy derivative spectrum calculated numerically from this data also show better-resolved structure in the E-2-peak region.