ILDCs for a planar junction between a perfectly conducting half-plane and a dielectric sheet

Citation
G. Pelosi et al., ILDCs for a planar junction between a perfectly conducting half-plane and a dielectric sheet, MICROW OPT, 22(2), 1999, pp. 93-95
Citations number
6
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
22
Issue
2
Year of publication
1999
Pages
93 - 95
Database
ISI
SICI code
0895-2477(19990720)22:2<93:IFAPJB>2.0.ZU;2-9
Abstract
Incremental length diffraction coefficients (ILDCs) are presented for the c anonical problem of a planar junction between a perfectly conducting half-p lane and a thin dielectric slab. (C) 1999 John Wiley & Sons, Inc.