Characterisation of DC reactive magnetron sputtered ZnO films prepared at different oxygen pressures

Citation
Tk. Subramanyam et al., Characterisation of DC reactive magnetron sputtered ZnO films prepared at different oxygen pressures, PHYS ST S-A, 173(2), 1999, pp. 425-436
Citations number
41
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
173
Issue
2
Year of publication
1999
Pages
425 - 436
Database
ISI
SICI code
0031-8965(199906)173:2<425:CODRMS>2.0.ZU;2-S
Abstract
Transparent conductive ZnO films have been prepared at different oxygen pre ssures in the range 1 x 10(-4) to 6 x 10(-3) mbar on glass substrates held at a fixed temperature of 663 K by reactively sputtering metallic zinc targ et in a de magnetron sputtering system. The deposited films were characteri sed (at 303 K) to study the influence of oxygen pressure on their structure , electrical and optical properties. Films with a low electrical resistivit y of 6.9 x 10(-2) Omega cm, high optical transmittance of 83% and an optica l band gap of 3.28 eV have been obtained at an oxygen pressure of 1 x 10(-3 ) mbar.