Tk. Subramanyam et al., Characterisation of DC reactive magnetron sputtered ZnO films prepared at different oxygen pressures, PHYS ST S-A, 173(2), 1999, pp. 425-436
Transparent conductive ZnO films have been prepared at different oxygen pre
ssures in the range 1 x 10(-4) to 6 x 10(-3) mbar on glass substrates held
at a fixed temperature of 663 K by reactively sputtering metallic zinc targ
et in a de magnetron sputtering system. The deposited films were characteri
sed (at 303 K) to study the influence of oxygen pressure on their structure
, electrical and optical properties. Films with a low electrical resistivit
y of 6.9 x 10(-2) Omega cm, high optical transmittance of 83% and an optica
l band gap of 3.28 eV have been obtained at an oxygen pressure of 1 x 10(-3
) mbar.