Characteristics of a thin-film sensor for a scanning SQUID microscope

Authors
Kirichenko, DE Pavolotskii, AB Prokhorova, IG Snigirev, OV
Citation
De. Kirichenko et al., Characteristics of a thin-film sensor for a scanning SQUID microscope, TECH PHYS, 44(7), 1999, pp. 839-843
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
TECHNICAL PHYSICS
ISSN journal
10637842 → ACNP
Volume
44
Issue
7
Year of publication
1999
Pages
839 - 843
Database
ISI
SICI code
1063-7842(199907)44:7<839:COATSF>2.0.ZU;2-P
Abstract
A description is given of the design, fabrication technology, and character istics of a sensor for a scanning magnetic microscope using a thin-film dc SQUID with Nb/Al2O3/Nb shunted Josephson tunnel junctions. It is shown that at a sample temperature of 4.2 K the spatial resolution of this detector i s 10 mu m with a field resolution of 70 pT/Hz(1/2).(C) 1999 American Instit ute of Physics. [S1063-7842(99)02307-7].