N. Bonnet et al., Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis, ULTRAMICROS, 77(3-4), 1999, pp. 97-112
The sophisticated acquisition procedures now available in spatially or time
resolved spectroscopies produce large amounts of data which require effici
ent automatic data processing procedures. In an electron energy loss spectr
oscopy (EELS) line-spectrum sequence, all individual spectra can be process
ed independently. However, it is better to consider the data set as a whole
and to process it as such. Multivariate statistical analysis (MSA) can be
used to identify several basic sources of information as contributing throu
gh a linear combination to the overall experimental data set. In this paper
we show that MSA can be applied to spatially resolved spectroscopy, but of
ten necessitates that extension from orthogonal to oblique analysis be perf
ormed. The aim is then to identify fine structures characteristic of EELS e
dges and to extract the signal specific of the interface. In the first sect
ion we present the overall methodology. Then it is illustrated through a si
mulation. Finally, we apply the method to the study of Si-SiO2 and SiO2-TiO
2 interfaces. We show that MSA constitutes a useful tool to estimate compon
ents present at the interface and the corresponding concentration profile o
f these components. (C) 1999 Elsevier Science B.V. All rights reserved.