Broadening of submonolayer CdSe sheets in CdSe ZnSe superlattices studied by x-ray diffraction

We present x-ray diffraction studies of a CdSe distribution profile along t he growth direction in CdSe/ZnSe submonolayer superlattices (SLs) grown by molecular beam epitaxy. The performed theoretical simulations show that the shape of both (004)- and (002)-reflection rocking curves is very sensitive to the vertical CdSe distribution around the intended deposition yplanes. In particular, broadening of the CdSe submonolayer insertions results in a decrease in SL (+/-1) and (+/-2) satellite intensities. Comparison of the s imulations and experimental data allows us to conclude that CdSe sheets in the as-grown SL samples are asymmetrically broaden up to 5 monolayers. (C) 1999 American Institute of Physics. [S0003-6951(99)00629-4].